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As the semiconductor industry pivots toward complex chiplet architectures and hyper-dense data center accelerators, the economics of quality necessitate shifting validation earlier in the production lifecycle. We are seeking a visionary Lead/Principal Diagnostics Engineer to drive our shift from proven post-silicon software validation frameworks and System-Level Tests (SLT) directly into Automated Test Equipment (ATE) and Wafer Sort environments.
Job Responsibility
Define the technical roadmap, architecture, and deployment strategy for migrating post-silicon SLT and functional GFX IP feature diagnostics onto wafer sort and ATE hardware configurations
Architect and develop software utilities/pipelines to convert functional diagnostic sequences, register configurations, and compute workloads into cycle-accurate vector formats (e.g., STIL, WGL, or proprietary tester formats) compatible with high-end ATE testers
Serve as the primary technical liaison between the GFX/Compute Diagnostics team, Product/Test Engineering, and Design-for-Test (DFT) teams
Analyze existing platform-level hardware/software dependencies (such as sideband management interfaces, firmware, and power management behaviors) to build deterministic, tester-friendly models that emulate host behaviors on ATE hardware
Optimize tester execution times (test cost reduction) while maximizing structural and functional test coverage for data center GPU IPs, focusing on massively parallel compute pipelines, high-bandwidth memory (HBM) controllers, and matrix math engines
Requirements
Proven industry experience in silicon engineering spanning post-silicon validation, product engineering, diagnostics development, or structural/functional test generation
Strong programming background in C/C++ and Python, with a concrete understanding of bare-metal or driver-level programming, registers, firmware interactions, and system memory maps
Proven hands-on experience with production-grade Automated Test Equipment platforms (e.g., V93000, UltraFLEX) and structural/functional testing at the wafer sort or final test level
Expert understanding of structural pattern generation, vector timing, clock domains, and diagnostic patterns (such as functional vectors, BIST/MBIST, or scan compression output)
Familiarity with high-volume manufacturing challenges unique to data center architectures, including high-power profiles, HBM integration, and multi-die chiplet interconnect protocols (e.g., UCIe, proprietary fabrics)
Deep understanding of GFX and compute architectures, with proven ability to design and implement diagnostic and test cases that maximize coverage and proactively identify silicon issues early
Understanding of AI/ML principles and some experience in applying LLM & ML models in applications
Experience with working in DevOps environment like GitHub, CI/CD pipelines
Excellent problem-solving abilities with a keen eye for detail are highly valued
Education: Bachelor’s, Master’s, or Ph.D. in Electrical Engineering, Computer Engineering, Computer Science, or a related technical field